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MIRTEC MV-6E OMNI AOI_Inspection machine used

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Description

Engineered for Accurate Defect Detection

The MIRTEC MV-6e OMNI redefines precision in Automated Optical Inspection, offering industry-leading 2D/3D capabilities. Designed with advanced technology, this in-line AOI system ensures unmatched accuracy in detecting defects on Surface Mount Technology (SMT) PCB assembly lines. Its innovative design makes it an indispensable asset for companies focused on quality and efficiency in manufacturing processes.

Streamlined Efficiency for High-Performance Operations

This high-performance system optimizes inspection speed and reliability, seamlessly integrating into your PCB assembly line without disrupting workflow. It’s built to handle complex circuit board assemblies while providing detailed defect analysis to reduce errors and enhance overall productivity.

Why Choose the MIRTEC MV-6e OMNI?

Designed for organizations that demand the best, the MIRTEC MV-6e OMNI delivers exceptional performance tailored to meet the unique needs of SMT operations. With its cutting-edge features, this AOI system ensures a significant improvement in quality control outcomes, helping manufacturers achieve their production goals with ease and consistency.

Specifications

  • OMNI-VISION 3D System: Combines a high-resolution top-down camera (15-megapixel or 25-megapixel CoaXPress depending on the exact configuration/year) with a Digital Multi-Frequency Quad Moiré 3D projection system.
  • Side-View Cameras: Equipped with multi-angle side-view cameras (typically four 10MP or 18MP cameras) for comprehensive shadow-free inspection.
  • Lighting Technology: Utilizes an 8-phase coaxial color lighting system optimized for highly reflective components and complex solder joints.
  • Defect Detection: Accurately measures solder volume, component height, coplanarity, bridging, missing parts, lifted IC leads, and polarity errors.
  • Smart Software: Integrates AI-based deep learning software and auto-teaching tools to standardize programming and minimize operator-dependent errors.

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