Description
The TRI TR7700Q is an innovative 3D Automated Optical Inspection (AOI) system meticulously crafted by Test Research, Inc. (TRI). It is designed to redefine precision in PCB and advanced semiconductor packaging inspection, offering manufacturers unparalleled accuracy and reliability.
Advanced Imaging Technologies
Equipped with cutting-edge 2D and 3D imaging capabilities, the TR7700Q integrates digital quad fringe pattern projection, laser technology, and Depth from Focus (DFF) imaging. This advanced combination ensures comprehensive and highly detailed inspection for detecting even the most minute defects.
Zero-Defect Quality Assurance
This state-of-the-art AOI system improves quality control processes by achieving zero-escape defect detection. Manufacturers can confidently address potential production flaws with precision and efficiency, resulting in enhanced performance and customer satisfaction.
Ideal for High-Tech Manufacturing
The TRI TR7700Q is perfectly suited for modern production lines involved in PCB manufacturing and advanced semiconductor packaging. Its robust performance and innovative features streamline inspection workflows, ensuring superior quality and reliability at every step.
Key Features & Capabilities
- Stop-and-Go Imaging: Enhances measurement stability and improves Gauge R&R.
- AI-Powered Smart Programming: Utilizes auto-learning algorithms to simplify setup and reduce new product introduction downtime.
- Metrology-Grade Measurements: Delivers precise 3D data and reliable defect classification for SMT and advanced packaging.
- Industry 4.0 Compatibility: Fully supports smart factory standards including IPC-CFX and The Hermes Standard (IPC-HERMES-9852).
Series Variants
- TR7700Q SII: Standard high-accuracy model featuring industry-leading inspection speeds up to 57 cm/sec.
- TR7700Q TB SII: Offers specialized 3D top-view and 2D bottom-view inspection tailored for Through-Hole Technology (THT) and Dual-in-line Packages (DiP).
- TR7700Q SII-S: High-resolution 2.5 µm





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